Kopishynska, O. P.Babentsov, V. N.Vlasenko, O. I.Mozol', P. E.Копішинська, Олена Петрівна2021-01-022021-01-021995-11-03https://dspace.pdau.edu.ua/handle/123456789/9094Vladimir N. Babentsov, Aleksandr I. Vlasenko, Peter E. Mozol', Elena P. Kopishinskaya. Complex diagnostic of CdTe after under-threshold laser irradiation by photoluminescence, photoconductivity, and electrophysical methods // Proceedings SPIE 2648, International Conference on Optical Diagnostics of Materials and Devices for Opto-, Micro-, and Quantum Electronics, (3 November 1995). 1995. P.370-377.OptoelectronicssemiconductorsLuminescenceLaser damage thresholdExcitons Raman scatteringRuby lasersArticle10.1117/12.226197