Публікація: Models for Assessing the Dependability of Programmable Devices with Controlled Multi-Level Degradation
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Дата
2025-07-03
Автори
Ponochovnyi, Y. L.
Makhmudov, H. Z.
Поночовний, Юрій Леонідович
Махмудов, Ханлар Зейналович
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Видання
Advances in Dependable Systems and Networks
Анотація
This paper explores the dependability and availability of programmable devices (PDs) with controlled multilevel degradation using Markov models. It presents a classification of single-fragment and multi-fragment models based on key parameters influencing failure rates and reconfiguration capabilities for PDs. The study develops a Markov availability model for PDs, detailing state transition matrices and simulation methods in MATLAB. Three PD models are considered: a single-fragment model, a multi-fragment model with degradation, and a multi-fragment model with degradation and reconfiguration. The simulation results demonstrate how reconfiguration and degradation affect system availability over extended operational periods. A comparison of availability functions across the models illustrates the effects of degradation and reconfiguration, delivering key findings for improving PD resilience in critical applications within harsh settings.
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Бібліографічний опис
Models for Assessing the Dependability of Programmable Devices with Controlled Multi-Level Degradation / V. Kharchenko et. al. In: Zamojski, W., Mazurkiewicz, J., Sugier, J., Walkowiak, T., Kacprzyk, J. (eds) Advances in Dependable Systems and Networks. DepCoS-RELCOMEX. 2025. Lecture Notes in Networks and Systems, vol 1427. Springer, Cham. Pp. 85-95.