Publication: Models for Assessing the Dependability of Programmable Devices with Controlled Multi-Level Degradation
No Thumbnail Available
Date
2025-07-03
Authors
Ponochovnyi, Y. L.
Makhmudov, H. Z.
Поночовний, Юрій Леонідович
Махмудов, Ханлар Зейналович
Journal Title
Journal ISSN
Volume Title
Publisher
Advances in Dependable Systems and Networks
Abstract
This paper explores the dependability and availability of programmable devices (PDs) with controlled multilevel degradation using Markov models. It presents a classification of single-fragment and multi-fragment models based on key parameters influencing failure rates and reconfiguration capabilities for PDs. The study develops a Markov availability model for PDs, detailing state transition matrices and simulation methods in MATLAB. Three PD models are considered: a single-fragment model, a multi-fragment model with degradation, and a multi-fragment model with degradation and reconfiguration. The simulation results demonstrate how reconfiguration and degradation affect system availability over extended operational periods. A comparison of availability functions across the models illustrates the effects of degradation and reconfiguration, delivering key findings for improving PD resilience in critical applications within harsh settings.
Description
Keywords
Citation
Models for Assessing the Dependability of Programmable Devices with Controlled Multi-Level Degradation / V. Kharchenko et. al. In: Zamojski, W., Mazurkiewicz, J., Sugier, J., Walkowiak, T., Kacprzyk, J. (eds) Advances in Dependable Systems and Networks. DepCoS-RELCOMEX. 2025. Lecture Notes in Networks and Systems, vol 1427. Springer, Cham. Pp. 85-95.