Complex diagnostic of CdTe after under-threshold laser irradiation by photoluminescence, photoconductivity, and electrophysical methods

dc.contributor.author	Kopishynska, O. P.
dc.contributor.author	Babentsov, V. N.
dc.contributor.author	Vlasenko, O. I.
dc.contributor.author	Mozol', P. E.
dc.contributor.author	Копішинська, Олена Петрівна
dc.date.accessioned	2021-01-02T16:21:54Z
dc.date.available	2021-01-02T16:21:54Z
dc.date.issued	1995-11-03
dc.description	Vladimir N. Babentsov, Aleksandr I. Vlasenko, Peter E. Mozol', Elena P. Kopishinskaya. Complex diagnostic of CdTe after under-threshold laser irradiation by photoluminescence, photoconductivity, and electrophysical methods // Proceedings SPIE 2648, International Conference on Optical Diagnostics of Materials and Devices for Opto-, Micro-, and Quantum Electronics, (3 November 1995). 1995. P.370-377.	uk_UA
dc.identifier.doi	10.1117/12.226197
dc.identifier.uri	https://dspace.pdau.edu.ua/handle/123456789/9094
dc.subject	Optoelectronics	uk_UA
dc.subject	semiconductors	uk_UA
dc.subject	Luminescence	uk_UA
dc.subject	Laser damage threshold	uk_UA
dc.subject	Excitons Raman scattering	uk_UA
dc.subject	Ruby lasers	uk_UA
dc.title	Complex diagnostic of CdTe after under-threshold laser irradiation by photoluminescence, photoconductivity, and electrophysical methods	uk_UA
dc.type	Article	uk_UA
local.department	3.3 Кафедра інформаційних систем та технологій	uk_UA

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Description:: Vladimir N. Babentsov, Aleksandr I. Vlasenko, Peter E. Mozol', Elena P. Kopishinskaya. Complex diagnostic of CdTe after under-threshold laser irradiation by photoluminescence, photoconductivity, and electrophysical methods // Proceedings SPIE 2648, International Conference on Optical Diagnostics of Materials and Devices for Opto-, Micro-, and Quantum Electronics, (3 November 1995). 1995. P.370-377.

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